Eceshi provides TOF-SIMS testing and surface chemical characterization services for materials research, semiconductor development, energy materials, polymers, coatings, thin films, interfaces, and other advanced materials.
TOF-SIMS is particularly sensitive to the outermost regions of a material and is therefore widely used for surface and interface characterization.
Elements: metal ions, inorganic elements, dopants, impurities, additives, contaminants
Molecular Fragments: polymers, organic coatings, surfactants, functional molecules, additives, degradation products
Isotopes: tracer studies, diffusion studies, isotope labeling, semiconductor research, materials transport studies
Sample Types for TOF-SIMS: metals and alloys, semiconductors, ceramics, polymers, organic materials, composite materials, thin films,coatings, battery materials, electronic materials, nanomaterials, catalysts, biological and biomaterial surfaces
Contact us to discuss your TOF-SIMS testing requirements, sample characteristics, target parameters, and experimental objectives.