Dynamic SIMS Testing Services: depth profiling, trace element analysis, dopant distribution analysis, impurity and contamination analysis, isotope analysis, multilayer and thin-film characterization.
Dynamic SIMS can be applied to a wide range of inorganic and advanced materials, including: semiconductor wafers and devices,silicon and compound semiconductor materials, thin films and multilayer structures, metal and metal alloy materials, dielectric and insulating films, solar cell and photovoltaic materials, battery materials and electrode coatings, ceramic and inorganic materials, glass and optical materials, polymers and selected organic materials, surface coatings and functional layers, research materials and nanostructured materials
Contact us to discuss your Dynamic SIMS testing requirements, sample characteristics, target parameters, and experimental objectives.