Cs-corrected TEM/STEM provides access to information across multiple length scales:
1. Morphology : particle size, particle shape, nanostructure, morphology, aggregation, surface structure
2. Crystal Structure: crystal lattice, phase structure, crystal orientation, lattice spacing, grain boundaries
3. Defects: dislocations, vacancies, stacking faults, twin boundaries,point defects, interface defects
4. Chemical Composition: elemental composition, element distribution, chemical-state variations, core-shell structures,interface composition
5. Electronic Structure: oxidation states, electronic structure, local bonding, fine structure from EELS
Applications of Cs-Corrected TEM
Nanomaterials: nanoparticles, nanowires, nanotubes, 2D materials, nuantum materials, nanocomposites
Catalysts: active nanoparticle structures, particle size, metal-support interfaces, catalyst dispersion, crystal defects, surface structures, elemental distributions
Battery Materials: electrode crystal structures, phase transformations, particle degradation, interface formation, element distribution, defect structures, electrode/electrolyte interfaces
Semiconductor Materials: semiconductor heterostructures, thin films, interfaces, defects, dopant distributions, nanodevices, crystal structures
Metals and Alloys: precipitates, dislocations, grain boundaries, phase interfaces, nanostructures, defect structures, atomic segregation
2D Materials: atomic arrangements, vacancies, grain boundaries, edge structures, layer structures, defects, elemental substitutions
Contact us to discuss your Cs-corrected TEM testing requirements, sample characteristics, target parameters, and experimental objectives.